Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences SEM Mount Hitachi S-500 Mount Hitachi S-500, 25 mm, Aluminum
Hitachi S-500 threaded pin SEM mounts are made from lathe finished ultra-pure aluminum.
Head: 1"
Height: 1/4"
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-2/4-4C, 400 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 2.0 µm holes with 4.0 µm spacing.
Mesh: 400
Material: Copper
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-1.2/1.3-4C, 400 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 1.2 µm holes with 1.3 µm spacing.
Mesh: 400
Material: Copper
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1/2" surface, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL JSM-840 scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1/2"
Height: 3/8"
Electron Microscopy Sciences ISI, ABT, Topcon SEM Cylinder Mount 23.7 mm surface, 9.5 mm height, Aluminum
ISI, ABT, Topcon specimen mounts are made from ultra-pure aluminum, lathe finish.
Head: 23.7 mm
Height: 9.5 mm
Electron Microscopy Sciences ProScope Case
Case is made of durable hard plastic shell and a soft inner mold with slots for the ProScope, all the lenses and the ProScope stand. Perfect for safely and securely taking your ProScope and lenses into field.
Electron Microscopy Sciences JEOL ISI SEM Cylinder Mount 5/8" surface, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL and ISI scanning electron microscopes. The mounts are made from ultra-pure aluminum with standard lathe finish.
Head: 5/8"
Height: 3/8"
Electron Microscopy Sciences BEEM Blocklock Storage Box for #69959
Specimen blocks are safely stored in Blocklock storage modules, a component in the BEEM Specimen Storage System 2000. All Blocklocks can be inserted in a Plastic Protective Box or, by utilizing the adhesive feature, mounted in combination with other Blocklock modules on the BEEM mounting panel that fits in a standard " D-Type" 3-ring binder. Heavy-duty, two tone plastic box supplied with indexed translucent labels for top or bottom of the box. Two-tone black/clear.
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-2/1-2C, 200 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 2.0 µm holes with 1.0 µm spacing.
Mesh: 200
Material: Copper
Electron Microscopy Sciences Mertz Graticle NGM1, 19mm
Used to estimate the three-dimensional surface areas or the surface density of a component in a given volume, when the component does not have a random orientation. It comprises a test system with parallel curved lines used for measuring the intersection of points. Reference: W.A. Mertz. "Mikroskopic" Vol. 22 1967 pp 132-142.
Size: 19 mm
Electron Microscopy Sciences Standard Pin SEM Stub Slotted 1" head with 1/2" Pin, Aluminum, 3.1 mm Pin diameter
Scanning electron microscope specimen mounts for FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan and Camscan SEMs. Made from lathe finished ultra-pure aluminum.
Head: 1"
Pin height: 1/2"
Pin diameter: 3.1 mm
Electron Microscopy Sciences JEOL SEM JSM 840 Cylinder Mount 1" surface, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL JSM-840 scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1"
Height: 3/8"
Electron Microscopy Sciences Press-To-Seal Clear Silicone Sheet, 0.25 mm thick
Isolate specimens using press-to-seal silicone isolators with removable hydrophobic barriers. Silicone isolators allow researchers to isolate specimens using removable hydrophobic barriers. They may be used to isolate cells grown in culture dishes or separate multiple specimens affixed to microscope slides. Without Adhesive.
Thickness: 0.25 mm
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1/2" surface, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL JSM-840 scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1/2"
Height: 3/8"
Electron Microscopy Sciences JEOL JSM 840 SEM Cylinder Mount 1/2" surface, 1/4" height, Carbon
Cylinder specimen mounts are for use with JEOL JSM-840 scanning electron microscopes. The mounts are made from spectroscopically pure carbon.
Head: 1/2"
Height: 1/4"